Buscar

 

RI UFLA (Universidade Federal de Lavras) >
Revistas UFLA >
CERNE >

Por favor, utilize esse identificador para citar este item ou usar como link: http://repositorio.ufla.br/jspui/handle/1/14564

Título: INTRODUCTION OF HEVEA CLONES IN THE NORTHWEST OF MINAS GERAIS STATE
Autor(es): Macedo, Renato Luiz Grisi
Oliveira, Tadário Kamel de
Venturin, Nelson
Gomes, Jozébio Esteves
Assunto: Introduction of forest species, growth, Hevea brasiliensis Müell Arg
Publicador: CERNE
CERNE
Publicação: 5-Out-2015
Outras Identificações: http://www.cerne.ufla.br/site/index.php/CERNE/article/view/473
Informações adicionais: The objective of this study was to evaluate the behavior of twelve hevea clones cultivated in northwest region of Minas Gerais State. The work was carried out in the Paracatu city. The experimental design was randomized blocks, made up by 12 hevea clones (Hevea brasiliensis Müell Arg.) (PB 235, PR 255, IAN 3193, IAN 3087, IAN 3156, IAN 2880, RRIM 600, RRIM 701, LCB 510, IAC 15, IPA 1 and GT 1), with four repetitions. The experimental plots were making up by eight plants, cultivated in the spacing 10 x 2m. At the 14 and 26 months post planting was evaluated the plants survival, circumference of the stem, height plants and the projection areas of crown (2nd evaluation). The increment in circumference of the stem and in height of plants were also determined. There was 100% of survival for all clones studied, on the two evaluations. The clones RRIM 600, IAC 15 and GT 1, with larger increment in height, and the clones GT 1, RRIM 701, PB 235 and PR 255, with bigger circumference of the stem increment, showed larger potential of growth. Due to plants height, the clones RRIM 600, IAC 15, GT 1 and PB 235 showed the best establishment capacity in the studied area.
Idioma: por
Aparece nas coleções: CERNE

Arquivos neste Item:

Não há arquivos associados para este Item.

Itens protegidos por copyright, com todos os direitos reservados, Salvo indicação em contrário.


Mostrar estatísticas

 


DSpace Software Copyright © 2002-2007 MIT and Hewlett-Packard - Feedback