Use este identificador para citar ou linkar para este item: http://repositorio.ufla.br/jspui/handle/1/30223
Título : Efficiency of x-ray test in the identification of damage and its relation with the pumpkin seeds quality
Autor: Antônio, Luiza do Nascimento
Catão, Hugo Cesar Rodrigues Moreira
Santos, Heloisa Oliveira dos
Pires, Raquel Maria de Oliveira
Ribeiro, Barbara Gomes
Von Pinho, Edila Vilela de Resende
Carvalho, Maria Laene Moreira de
Caldeira, Carla Massimo
Palavras-chave: Curcubita moschata
Image analisys
Pumpkin seeds - Physiological quality
Data da publicação: Fev-2016
Referência: ANTÔNIO, L. do N. et al. Efficiency of x-ray test in the identification of damage and its relation with the pumpkin seeds quality. International Journal of Current Research, [S.l.], v. 8, n. 2, p. 26471-26475, Feb. 2016.
Abstract: The high quality seeds use for the pumpkin fruit production is an important factor because it is directly related to productivity. The objective of this study was to evaluate the efficiency of x-ray test in the physiological and biochemical quality of pumpkin seeds (Curcubita moschata). Seeds of three different lots were submitted to x-ray test in Faxitron x-ray device, MX20 model, DC-12 option, with an intensity of 18 kV per 20 seconds. After, the seeds were separated into three different classes: full, damaged and translucent, being these submitted to germination and emergence tests using 10 replicates of 10 seeds from each lot. Tetrazolium test still was performed in the remaining seeds. For the biochemical quality assessment was verified the activity of enzymes catalase and superoxide dismutase from different types of classes and lots of seeds. The use of x-ray technique is effective for detecting abnormalities in pumpkin seeds that negatively affect germination. The enzymes catalase expression and superoxide dismutase is directly related to the seeds quality and through these is possible to separate the lots in the same classes established by x-ray test.
URI: http://repositorio.ufla.br/jspui/handle/1/30223
Idioma: pt_BR
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