Transmission electron microscopy as a realistic data source for the micromagnetic simulation of polycrystalline nickel nanowires

Abstract

Transmission electron microscopy data was used as a starting point for the proposed model in micromagnetic simulation for electrodeposited nickel nanowires. We used the dark field image analysis and proposed the real crystal format for the deposited nanowire and the suggested format was used for the generation of the finite elements network in the numerical model using NMAG. The resolved equations generated the coercivity field dependence with the angle of application of the external magnetic field. The same analysis was carried out for the magnetic remanence data and compared with the experimental results. Our results show the significant importance of electron microscopy analysis in the magnetic studies using realistic models. The problem of the reversion for the magnetic moments in magnetic nanowires is an unresolved question and our proposal is that reversion studies need start in the previous microscopy analyses of the real microstructure of nanowires.